Advanced Production Testing of RF, SoC, and SiP Devices

Advanced Production Testing of RF, SoC, and SiP Devices

Preface

Chapter 1

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Concepts of Production Testing of RF, SoC, and SiP Devices

Chapter 2

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Tests and Measurements I: Fundamental RF Measurements

Chapter 3

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Tests and Measurements II: Distortion

Chapter 4

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Tests and Measurements III: Noise

Chapter 5

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Advances in Testing RF and SoC Devices

Chapter 6

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Production Test Equipment

Chapter 7

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Cost of Test

Chapter 8

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Calibration

Chapter 9

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Contactors

Chapter 10

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Handlers

Chapter 11

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Load Boards

Chapter 12

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Wafer Probing

Appendix A

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Power and Voltage Conversions

Appendix B

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VSWR, Return Loss, and Reflection Coefficient

Appendix C

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RF Coaxial Cables

Appendix D

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RF Connectors

Appendix E

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Decimal to Hexadecimal and ASCII Conversions

Appendix F

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Numerical Prefixes