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Physical Principles of Electron Microscopy—An Introduction to TEM, SEM, and AEM

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by Ray F. Egerton

2005 (214 pages)

ISBN:9780387258003

Providing an introduction to the theory and current practice of electron microscopy, this text shows how principles of electricity and magnetism, optics and modern physics have been used to develop instruments with a wide application in many fields.

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Table of Contents

Physical Principles of Electron Microscopy—An Introduction to TEM, SEM, and AEM
Preface
Chapter 1	-	An Introduction to Microscopy
Chapter 2	-	Electron Optics
Chapter 3	-	The Transmission Electron Microscope
Chapter 4	-	Tem Specimens and Images
Chapter 5	-	The Scanning Electron Microscope
Chapter 6	-	Analytical Electron Microscopy
Chapter 7	-	Recent Developments
Appendix A	-	Mathematical Derivations
References